Materials information in Siemens NX
Direct access to validated materials property data from within NX
Deploy accurate, up-to-date, approved materials information to engineers and designers throughout the company, for use within their NX workflows
GRANTA MI:Materials Gateway for NX
GRANTA MI:Materials Gateway for NX enables users of the NX software from Siemens PLM to directly access and use validated materials property data from a GRANTA MI database, while working in their familiar CAD/CAE environment.
MI:Materials Gateway provides tools to access and browse the corporate materials database (and Granta-supplied reference data on materials properties), to choose applicable materials, and to assign those materials to parts within the NX model.
Designers can ensure that parts have the correct density for mass property calculations, and can generate reports summarising their materials assignments. Analysts can select and assign fully-traceable CAE materials models for use in simulation. All of these tasks can be performed quickly, interactively, and with no risk of error due to data transfer.
GRANTA MI:Materials Gateway for NX. Search and browse your corporate materials database (and/or Granta-supplied reference information), assign your selected materials to your NX model, and explore the design implications.
If you are an NX user
If your organization has enabled GRANTA MI access from your NX implementation, then you can access MI:Materials Gateway via the option in the NX toolbar.
You can access the User Guide, updates, and other resources here »
If your organization is interested in enabling GRANTA MI access, contact us for more information.
If you are not an NX user…
Find out about the GRANTA MI system for materials information management and its range of options for delivering materials property data to engineers, designers, and analysts. More »
GRANTA MI enables access to materials data via a simple web browser user interface, or integrated with a range of CAD and CAE systems through the MI:Materials Gateway technology. More »